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Nobel Prize Underscores Value of Superresolution Microscopy
Nobel Prize Underscores Value of Superresolution Microscopy
Carl Zeiss Microscopy
16/10/2014

ZEISS congratulates Eric Betzig, Stefan Hell and William Moerner on winning the 2014 Nobel Prize for Chemistry. All three underscored the value of microscopy in research with their discovery of methods to achieve superresolution.The limit of optical resolution calculated by Ernst Abbe, company founder Carl Zeiss's partner, in the 19th century has been considerably improved through the use of modern technologies. Today, photo-activated localization microscopy (PALM) enables...
Toshiba Nanoanalysis Corporation Expands Capabilities with ZEISS Xradia 520 Versa
Toshiba Nanoanalysis Corporation Expands Capabilities with ZEISS Xradia 520 Versa
Carl Zeiss Microscopy
21/03/2014

Thornwood, N.Y. – Carl Zeiss X-ray Microscopy, formerly Xradia, Inc., announced today that Kawasaki, Japan-based Toshiba Nanoanalysis Corporation has selected the recently-introduced ZEISS Xradia 520 Versa 3D X-ray microscope (XRM) to expand the capabilities of its busy analysis lab. Toshiba Nanoanalysis offers imaging services for complex analytical demands in semiconductor, biosciences and materials science research for industry and academia.According to Mr....
ZEISS LAUNCHES PROMOTION ON THE ELYRA P.1 3D SUPERRESOLUTION MICROSCOPE
ZEISS LAUNCHES PROMOTION ON THE ELYRA P.1 3D SUPERRESOLUTION MICROSCOPE
Carl Zeiss Microscopy
24/02/2014

Special offer for the highest resolution in light microscopy Thornwood, N.Y. – Carl Zeiss Microscopy, LLC announces the launch of a special promotion on the ZEISS ELYRA P.1, the ultimate in three-dimensional, superresolution light microscopy. Using PALM or dSTORM techniques, the ELYRA P.1 can localize fluorescently-labeled structures in three dimensions yielding achievable resolutions down to 20 nm laterally and 50 nm axially. Detection with an effective resolution...
ZEISS Crossbeam Sets New Standards in 3D Nanotomography and Nanofabrication
ZEISS Crossbeam Sets New Standards in 3D Nanotomography and Nanofabrication
Carl Zeiss Microscopy
30/01/2014

Fast Materials Processing and High Resolution Imaging JENA, REGENSBURG/GermanyZEISS will be presenting the first system of the new Crossbeam series at the MC 2013 in Regensburg, Germany. Its outstanding features include high speed in materials analysis and processing and its wide diversity of applications. Time intensive 3D experiments that used to run for several days can now be completed overnight.The newly developed focused ion beam (FIB) column enables fast and...
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