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ZEISS Crossbeam 340 and Crossbeam 540

ZEISS Crossbeam 340 and Crossbeam 540


Supplier: Carl Zeiss Microscopy
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With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale.

Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples.


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Additional info: FIB-SEM for High Throughput Nanotomography and Nanofabrication
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