delivers a groundbreaking increase in resolution over conventional SEM. EVO HD introduces high definition into conventional scanning electron microscopy.
The unmatched low-kV resolution makes the EVO HD the premier choice for challenging specimens, the imaging of surface detail and for beam-sensitive materials. Enhanced analytical accuracy required for a wide range of applications is realized by clear resolution improvements at high probe currents. This technology demonstrates unchallenged performance in the conventional SEM (C-SEM) arena.
EVO HD dramatically reduces the gap in imaging resolution between C-SEM and field emission SEM (FE-SEM).
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