The VK-X Series 3D Laser Scanning Microscope expands the capabilities of laser microscopy. Combining features of an optical microscope, roughness gauge, laser profilometer, and scanning electron microscope, our laser scanning microscope performs non-contact surface profile, surface roughness, and thickness measurements without the need for sample preparation.
By using a laser to scan across a target, this system can produce fully-focused images with incredibly high-resolution on nearly any type of material.
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